Efficiency of rietveld-based XPD quantification on mineral abundance in granitic rocks, a case study
The structure-sensitive and standardless phase quantification method based on a Rietveld analysis of X-ray powder diffraction data was compared to some traditional techniques. It was found that the Rietveld-based method is at least equal, in several cases superior to the R1R technique, and can be a...
Elmentve itt :
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| Dokumentumtípus: | Cikk |
| Megjelent: |
Department of Mineralogy, Geochemistry and Petrology, University of Szeged
Szeged
2004
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| Sorozat: | Acta mineralogica-petrographica
45 No. 1 |
| Kulcsszavak: | Földtan, Ásványtan, Kőzettan |
| Tárgyszavak: | |
| Online Access: | http://acta.bibl.u-szeged.hu/25115 |
| Tartalmi kivonat: | The structure-sensitive and standardless phase quantification method based on a Rietveld analysis of X-ray powder diffraction data was compared to some traditional techniques. It was found that the Rietveld-based method is at least equal, in several cases superior to the R1R technique, and can be a fast and simple substitute for the optical modal analysis. At the same time it is shown that the points of a Rietveldbased rock classification, using the QAP rock classification of Streckeisen, can be erroneously shifted on the diagram towards the higher plagioclase containing types due to the pcrthitic exsolution of K-feldspar and consequent inherent overestimation of the abundance of plagioclase. |
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| Terjedelem/Fizikai jellemzők: | 49-53 |
| ISSN: | 0365-8066 |