Determination of the thickness and the refractive index of V2O5 thin films from reflectance interference spectra

Saved in:
Bibliographic Details
Main Authors: Süli Árpád
Michailovits Lehel
Hevesi Imre
Format: Article
Published: 1979
Series:Acta physica et chemica 25 No. 1-2
Kulcsszavak:Természettudomány, Kémia, Fizika
Online Access:http://acta.bibl.u-szeged.hu/24114
Description
Physical Description:29-41
ISSN:0001-6721