An addition to the methods of test determination for fault detection in combinational circuits
We propose a procedure for determining fault detection tests for single and multiple fault in combinational circuits. The stuck-at-fault model is used. By the proposed procedure all test vectors for single and multiple stuck-at-fault in combinational circuit are determined. The path sensitization me...
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| Dokumentumtípus: | Cikk |
| Megjelent: |
2004
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| Sorozat: | Acta cybernetica
16 No. 4 |
| Kulcsszavak: | Számítástechnika, Nyelvészet - számítógép alkalmazása |
| Tárgyszavak: | |
| Online Access: | http://acta.bibl.u-szeged.hu/12740 |
| Tartalmi kivonat: | We propose a procedure for determining fault detection tests for single and multiple fault in combinational circuits. The stuck-at-fault model is used. By the proposed procedure all test vectors for single and multiple stuck-at-fault in combinational circuit are determined. The path sensitization method is used in the test signal propagation while test signals are defined on a four element set. The procedure can also be applied to the fault detection in programmable logic devices. We consider two-level combinational circuits which are realized by the PAL architecture and we propose a procedure for determining a test set which detects all single stuck-at-faults. As a mathematical tool, the cube theory is used. |
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| Terjedelem/Fizikai jellemzők: | 545-566 |
| ISSN: | 0324-721X |