Analysis of waveguide architectures of InGaN/GaN diode lasers by nearfield optical microscopy
Elmentve itt :
Szerzők: | |
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Dokumentumtípus: | Könyv része |
Megjelent: |
International Society for Optics and Photonics
Bellingham (WA)
2017
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Sorozat: | Proceedings of SPIE
Novel In-Plane Semiconductor Lasers XVI |
Tárgyszavak: | |
doi: | 10.1117/12.2249563 |
mtmt: | 33298452 |
Online Access: | http://publicatio.bibl.u-szeged.hu/33981 |
LEADER | 00970naa a2200265 i 4500 | ||
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001 | publ33981 | ||
005 | 20240704083555.0 | ||
008 | 240704s2017 hu o 000 eng d | ||
020 | |a 9781510606876; 9781510606883 | ||
024 | 7 | |a 10.1117/12.2249563 |2 doi | |
024 | 7 | |a 33298452 |2 mtmt | |
040 | |a SZTE Publicatio Repozitórium |b hun | ||
041 | |a eng | ||
100 | 1 | |a Friede Sebastian | |
245 | 1 | 0 | |a Analysis of waveguide architectures of InGaN/GaN diode lasers by nearfield optical microscopy |h [elektronikus dokumentum] / |c Friede Sebastian |
260 | |a International Society for Optics and Photonics |b Bellingham (WA) |c 2017 | ||
300 | |a 7 | ||
490 | 0 | |a Proceedings of SPIE | |
490 | 0 | |a Novel In-Plane Semiconductor Lasers XVI | |
650 | 4 | |a Fizikai tudományok | |
700 | 0 | 1 | |a Tomm Jens W. |e aut |
700 | 0 | 1 | |a Kühn Sergei |e aut |
700 | 0 | 1 | |a Hoffmann Veit |e aut |
700 | 0 | 1 | |a Wenzel Hans |e aut |
856 | 4 | 0 | |u http://publicatio.bibl.u-szeged.hu/33981/1/33298452.pdf |z Dokumentum-elérés |